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Results: 26-33/33
Authors:
Leumann, C
Allan, M
Burger, U
Erni, B
Grutzmacher, H
Hauser, A
Heimgartner, H
Huber, HP
Jenny, T
Neier, R
Oehme, M
Suss-Fink, G
Wyler, H
Citation: C. Leumann et al., NSCH-Kommission-Curriculum-Chemie: Young chemists' research, degrees and job opportunities, 1992-1996 (statistical report), CHIMIA, 53(6), 1999, pp. 256-260
Authors:
Oehme, M
Citation: M. Oehme, Separation and structural elucidation of xenobiotics in the pico- to nanogram scale, CHIMIA, 53(5), 1999, pp. 218-219
Authors:
Oehme, M
Citation: M. Oehme, HPLC-MS and CE-MS, finally mature techniques for routine analysis?, CHIMIA, 53(10), 1999, pp. 467-468
Authors:
Berger, U
Kolliker, S
Oehme, M
Citation: U. Berger et al., Structure elucidation and quantification by HPLC ion-trap multiple mass spectrometry, CHIMIA, 53(10), 1999, pp. 492-497
Authors:
Bauer, M
Oehme, M
Lyutovich, K
Kasper, E
Citation: M. Bauer et al., Ion assisted MBE growth of SiGe nanostructures, THIN SOL FI, 336(1-2), 1998, pp. 104-108
Authors:
Schollhorn, C
Oehme, M
Bauer, M
Kasper, E
Citation: C. Schollhorn et al., Coalescence of germanium islands on silicon, THIN SOL FI, 336(1-2), 1998, pp. 109-111
Authors:
Kasper, E
Lyutovich, K
Bauer, M
Oehme, M
Citation: E. Kasper et al., New virtual substrate concept for vertical MOS transistors, THIN SOL FI, 336(1-2), 1998, pp. 319-322
Authors:
Oehme, M
Bauer, M
Citation: M. Oehme et M. Bauer, Optical on wafer measurement of Ge content of virtual SiGe-substrates, THIN SOL FI, 336(1-2), 1998, pp. 347-349