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Ben-David, M
Oksman, M
Katzir, A
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Authors:
Golan, G
Rabinovich, E
Inberg, A
Oksman, M
Rancoita, PG
Rattaggi, M
Gartsman, K
Seidman, A
Croitoru, N
Citation: G. Golan et al., Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron-irradiated silicon detectors, MICROELEC J, 31(11-12), 2000, pp. 937-944
Authors:
Golan, G
Rabinovich, E
Inberg, A
Axelevitch, A
Oksman, M
Rosenwaks, Y
Kozlovsky, A
Rancoita, PG
Rattaggi, M
Seidman, A
Croitoru, N
Citation: G. Golan et al., Dislocations structure investigation in neutron irradiated silicon detectors using AFM and microhardness measurements, MICROEL REL, 39(10), 1999, pp. 1497-1504