Authors: Olafsson, HO Sveinbjornsson, EO Rudenko, TE Tyagulski, IP Osiyuk, IN Lysenko, VS

Citation: Ho. Olafsson et al., Border traps in 6H-SiC metal-oxide-semiconductor capacitors investigated by the thermally-stimulated current technique, APPL PHYS L, 79(24), 2001, pp. 4034-4036

Authors: Olafsson, HO Gudmundsson, JT Svavarsson, HG Gislason, HP

Citation: Ho. Olafsson et al., Hydrogen passivation of AlxGa1-xAs/GaAs studied by surface photovoltage spectroscopy, PHYSICA B, 274, 1999, pp. 689-692