Authors:
Olafsson, HO
Sveinbjornsson, EO
Rudenko, TE
Tyagulski, IP
Osiyuk, IN
Lysenko, VS
Citation: Ho. Olafsson et al., Border traps in 6H-SiC metal-oxide-semiconductor capacitors investigated by the thermally-stimulated current technique, APPL PHYS L, 79(24), 2001, pp. 4034-4036