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Electronic structure theory and mechanisms of the oxide trapped hole annealing process
Authors: Karna, SP Pineda, AC Pugh, RD Shedd, WM Oldham, TR
Citation: Sp. Karna et al., Electronic structure theory and mechanisms of the oxide trapped hole annealing process, IEEE NUCL S, 47(6), 2000, pp. 2316-2321
1999 special NSREC issue of the IEEE transactions an nuclear science - Guest editor's comments
Authors: Oldham, TR
Citation: Tr. Oldham, 1999 special NSREC issue of the IEEE transactions an nuclear science - Guest editor's comments, IEEE NUCL S, 46(6), 1999, pp. 1331-1332
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