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Results:
1-11
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Results: 11
Authors:
Onuki, J
Chonan, Y
Komiyama, T
Nihei, M
Saitou, R
Suwa, M
Morita, T
Citation: J. Onuki et al., A void free soldering process in large-area, high power insulated gate bipolar transistor modules, JPN J A P 1, 40(6A), 2001, pp. 3985-3991
Authors:
Teixeira, PC
Onuki, J
Medeiros, MHG
Dornemann, D
Di Mascio, P
Citation: Pc. Teixeira et al., DNA damage by 3,6-dihydropyrazine-2,5-dipropanoic acid, the cyclic dimerization product of 5-aminolevulinic acid, BIOL CHEM, 382(6), 2001, pp. 913-918
Authors:
Onuki, J
Chonan, Y
Komiyama, T
Nihei, M
Suwa, M
Kitano, M
Citation: J. Onuki et al., Reliability enhancement of solder joints made by a void free soldering process, MATER TRANS, 42(5), 2001, pp. 890-893
Authors:
Chonan, Y
Komiyama, T
Onuki, J
Citation: Y. Chonan et al., Interface reaction between solder and plated nickel film, MATER TRANS, 42(4), 2001, pp. 697-701
Authors:
Onuki, J
Nihei, M
Funamoto, T
Doi, H
Fukui, Y
Citation: J. Onuki et al., Joining of oxide dispersion strengthened Ni based super alloys, MATER T JIM, 42(2), 2001, pp. 365-371
Authors:
Okami, K
Onuki, J
Ishida, K
Kido, T
Takahashi, M
Citation: K. Okami et al., Tortuosity of the internal carotid artery - report of three cases and MR-angiography imaging, AURIS NAS L, 28(4), 2001, pp. 373-376
Authors:
Onuki, J
Koizumi, M
Suwa, M
Citation: J. Onuki et al., Reliability of thick Al wire bonds in IGBT modules for traction motor drives, IEEE T AD P, 23(1), 2000, pp. 108-112
Authors:
Di Mascio, P
Teixeira, PC
Onuki, J
Medeiros, MHG
Dornemann, D
Douki, T
Cadet, J
Citation: P. Di Mascio et al., DNA damage by 5-aminolevulinic and 4,5-dioxovaleric acids in the presence of ferritin, ARCH BIOCH, 373(2), 2000, pp. 368-374
Authors:
Morita, T
Kato, M
Onuki, J
Onose, H
Matsuura, N
Sakurada, S
Citation: T. Morita et al., Investigation of low loss and high reliability encapsulation technology inlarge-area, high-power semiconductor devices, JPN J A P 1, 38(11), 1999, pp. 6232-6236
Authors:
Ummus, RE
Onuki, J
Dornemann, D
Medeiros, MHG
Di Mascio, P
Citation: Re. Ummus et al., Measurement of 4,5-dioxovaleric acid by high-performance liquid chromatography and fluorescence detection, J CHROMAT B, 729(1-2), 1999, pp. 237-243
Authors:
Onuki, J
Nihei, M
Suwa, M
Goshima, H
Citation: J. Onuki et al., Formation of W underlayer by switching bias sputtering to plug 0.25 mu m contact holes, J VAC SCI B, 17(3), 1999, pp. 1028-1033
Risultati:
1-11
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