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Scanning near-field ellipsometric microscope-imaging ellipsometry with a lateral resolution in nanometer range
Authors:
Karageorgiev, P Orendi, H Stiller, B Brehmer, L
Citation:
P. Karageorgiev et al., Scanning near-field ellipsometric microscope-imaging ellipsometry with a lateral resolution in nanometer range, APPL PHYS L, 79(11), 2001, pp. 1730-1732
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