Authors:
Bazzali, A
Borionetti, G
Falster, R
Gambaro, D
Mule'Stagno, L
Olmo, M
Orizio, R
Porrini, M
Citation: A. Bazzali et al., Non-destructive diagnostic techniques for oxygen precipitates in Czochralski silicon, MAT SC S PR, 4(1-3), 2001, pp. 23-26
Authors:
Geranzani, P
Porrini, M
Orizio, R
Falster, R
Citation: P. Geranzani et al., Minority carrier lifetime dependence on resistivity in high-purity p-type silicon, J ELCHEM SO, 146(9), 1999, pp. 3494-3499