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Results: 1-2 |
Results: 2
Efficient generation of pre-silicon MOS model parameters for early circuitdesign
Authors: Orshansky, M An, J Jiang, C Liu, B Riccobene, C Hu, CM
Citation: M. Orshansky et al., Efficient generation of pre-silicon MOS model parameters for early circuitdesign, IEEE J SOLI, 36(1), 2001, pp. 156-159
Direct sampling methodology for statistical analysis of scaled CMOS technologies
Authors: Orshansky, M Chen, JC Hu, CM
Citation: M. Orshansky et al., Direct sampling methodology for statistical analysis of scaled CMOS technologies, IEEE SEMIC, 12(4), 1999, pp. 403-408
Risultati: 1-2 |