Authors:
Ortiz, AL
Sanchez-Bajo, F
Padture, NP
Cumbrera, FL
Guiberteau, F
Citation: Al. Ortiz et al., Quantitative polytype-composition analyses of SiC using X-ray diffraction:a critical comparison between the polymorphic and the Rietveld methods, J EUR CERAM, 21(9), 2001, pp. 1237-1248
Citation: F. Sanchez-bajo et al., Accuracy of X-ray diffraction SiC polytype-composition analyses performed by a polymorphic method, J MAT SCI L, 20(4), 2001, pp. 297-299
Authors:
Xu, HW
Bhatia, T
Deshpande, SA
Padture, NP
Ortiz, AL
Cumbrera, FL
Citation: Hw. Xu et al., Microstructural evolution in liquid-phase-sintered SiC: Part I, effect of starting powder, J AM CERAM, 84(7), 2001, pp. 1578-1584
Authors:
Deshpande, SA
Bhatia, T
Xu, HW
Padture, NP
Ortiz, AL
Cumbrera, FL
Citation: Sa. Deshpande et al., Microstructural evolution in liquid-phase-sintered SiC: Part II, effects of planar defects and seeds in the starting powder, J AM CERAM, 84(7), 2001, pp. 1585-1590
Authors:
Ortiz, AL
Cumbrera, FL
Sanchez-Bajo, F
Guiberteau, F
Caruso, R
Citation: Al. Ortiz et al., Fundamental parameters approach in the Rietveld method: a study of the stability of results versus the accuracy of the instrumental profile, J EUR CERAM, 20(11), 2000, pp. 1845-1851
Citation: Al. Ortiz et al., On the analysis of noncatalytic gas-solid kinetics data having weak temperature dependence, CHEM ENG CO, 177, 2000, pp. 65-85
Authors:
Ortiz, AL
Cumbrera, FL
Sanchez-Bajo, F
Guiberteau, F
Xu, HW
Padture, NP
Citation: Al. Ortiz et al., Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method, J AM CERAM, 83(9), 2000, pp. 2282-2286