Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-2
|
Results: 2
Hot-electron degradation in hydrogenated amorphous-silicon-nitride thin-film diodes
Authors:
Oversluizen, G Zieren, V Johnson, MT van der Put, AA Lodders, WHM
Citation:
G. Oversluizen et al., Hot-electron degradation in hydrogenated amorphous-silicon-nitride thin-film diodes, J APPL PHYS, 89(10), 2001, pp. 5491-5496
Discharge efficiency in plasma displays
Authors:
Oversluizen, G Klein, M de Zwart, S van Heusden, S Dekker, T
Citation:
G. Oversluizen et al., Discharge efficiency in plasma displays, APPL PHYS L, 77(7), 2000, pp. 948-950
Risultati:
1-2
|