Authors:
CAMPBELL IH
FERRARIS JP
HAGLER TW
JOSWICK MD
PARKER ID
SMITH DL
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Citation: Bh. Cumpston et al., IN-SITU CHARACTERIZATION OF THE OXIDATIVE-DEGRADATION OF A POLYMERIC LIGHT-EMITTING DEVICE, Journal of applied physics, 81(8), 1997, pp. 3716-3720
Citation: Ps. Davids et al., CHARGE INJECTION IN ORGANIC LIGHT-EMITTING-DIODES - TUNNELING INTO LOW MOBILITY MATERIALS, Applied physics letters, 69(15), 1996, pp. 2270-2272
Citation: Ih. Campbell et al., DIRECT MEASUREMENT OF THE INTERNAL ELECTRIC-FIELD DISTRIBUTION IN A MULTILAYER ORGANIC LIGHT-EMITTING DIODE, Applied physics letters, 67(21), 1995, pp. 3171-3173
Citation: Aj. Heeger et al., CARRIER INJECTION INTO SEMICONDUCTING POLYMERS - FOWLER-NORDHEIM FIELD-EMISSION TUNNELING, Synthetic metals, 67(1-3), 1994, pp. 23-29
Citation: Id. Parker, CARRIER TUNNELING AND DEVICE CHARACTERISTICS IN POLYMER LIGHT-EMITTING-DIODES, Journal of applied physics, 75(3), 1994, pp. 1656-1666
Citation: Id. Parker et Hh. Kim, FABRICATION OF POLYMER LIGHT-EMITTING-DIODES USING DOPED SILICON ELECTRODES, Applied physics letters, 64(14), 1994, pp. 1774-1776