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ON THE RELATIONSHIPS AMONG THE ALL-USES, ALL-DU-PATHS, AND ALL-EDGES TESTING CRITERIA
Authors: PARRISH AS ZWEBEN SH
Citation: As. Parrish et Sh. Zweben, ON THE RELATIONSHIPS AMONG THE ALL-USES, ALL-DU-PATHS, AND ALL-EDGES TESTING CRITERIA, IEEE transactions on software engineering, 21(12), 1995, pp. 1006-1009
CLARIFYING SOME FUNDAMENTAL-CONCEPTS IN SOFTWARE TESTING
Authors: PARRISH AS ZWEBEN SH
Citation: As. Parrish et Sh. Zweben, CLARIFYING SOME FUNDAMENTAL-CONCEPTS IN SOFTWARE TESTING, IEEE transactions on software engineering, 19(7), 1993, pp. 742-746
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