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Results: 3
COMBINED INSTRUMENT FOR THE ONLINE INVESTIGATION OF PLASMA-DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON-SPECTROSCOPYAND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
Authors: JAHN PW PETRAT FM WOLANY D DEIMEL M GANTENFORT T SCHMERLING C WENSING H WIEDMANN L BENNINGHOVEN A
Citation: Pw. Jahn et al., COMBINED INSTRUMENT FOR THE ONLINE INVESTIGATION OF PLASMA-DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON-SPECTROSCOPYAND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(3), 1994, pp. 671-676
COMPARATIVE IN-SITU TOF-SIMS XPS STUDY OF POLYSTYRENE MODIFIED BY ARGON, OXYGEN AND NITROGEN PLASMAS/
Authors: PETRAT FM WOLANY D SCHWEDE BC WIEDMANN L BENNINGHOVEN A
Citation: Fm. Petrat et al., COMPARATIVE IN-SITU TOF-SIMS XPS STUDY OF POLYSTYRENE MODIFIED BY ARGON, OXYGEN AND NITROGEN PLASMAS/, Surface and interface analysis, 21(6-7), 1994, pp. 402-406
IN-SITU TOF-SIMS XPS INVESTIGATION OF NITROGEN PLASMA-MODIFIED POLYSTYRENE SURFACES
Authors: PETRAT FM WOLANY D SCHWEDE BC WIEDMANN L BENNINGHOVEN A
Citation: Fm. Petrat et al., IN-SITU TOF-SIMS XPS INVESTIGATION OF NITROGEN PLASMA-MODIFIED POLYSTYRENE SURFACES, Surface and interface analysis, 21(5), 1994, pp. 274-282
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