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Authors: LUKYANCHIKOVA NB PETRICHUK MV GARBAR NP SIMOEN E CLAEYS A
Citation: Nb. Lukyanchikova et al., IMPACT OF THE FREE-ELECTRON DISTRIBUTION ON THE RANDOM TELEGRAPH SIGNAL CAPTURE KINETICS IN SUBMICRON N-METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS, Applied physics letters, 73(17), 1998, pp. 2444-2446

Authors: LUKYANCHIKOVA P PETRICHUK MV GARBAR N SIMOEN E CLAEYS C
Citation: P. Lukyanchikova et al., IDENTIFICATION OF ISOLATION-EDGE RELATED RANDOM TELEGRAPH SIGNALS IN SUBMICRON SILICON METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS, Applied physics letters, 71(26), 1997, pp. 3874-3876
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