Authors: PICKEL JC

Citation: Jc. Pickel, SINGLE-EVENT EFFECTS RATE PREDICTION (VOL 43, PG 483, 1996), IEEE transactions on nuclear science, 43(4), 1996, pp. 2454-2454

Authors: PICKEL JC

Citation: Jc. Pickel, SINGLE EVENT DAMAGE EFFECTS IN CRYOGENIC CMOS MICROELECTRONICS, IEEE transactions on nuclear science, 43(3), 1996, pp. 912-917

Authors: PICKEL JC

Citation: Jc. Pickel, SINGLE-EVENT EFFECTS RATE PREDICTION, IEEE transactions on nuclear science, 43(2), 1996, pp. 483-495

Authors: PEASE RL CLARK SD COLE PL KRIEG JF PICKEL JC

Citation: Rl. Pease et al., TOTAL-DOSE RESPONSE OF TRANSCONDUCTANCE IN MOSFETS AT LOW-TEMPERATURE, IEEE transactions on nuclear science, 41(3), 1994, pp. 549-554

Authors: PETERSEN EL PICKEL JC SMITH EC RUDECK PJ LETAW JR

Citation: El. Petersen et al., GEOMETRICAL FACTORS IN SEE RATE CALCULATIONS, IEEE transactions on nuclear science, 40(6), 1993, pp. 1888-1909