Authors: WOLTJER R PAULZEN GM POMP HG LIFKA H WOERLEE PH

Citation: R. Woltjer et al., 3 HOT-CARRIER DEGRADATION MECHANISMS IN DEEP-SUBMICRON PMOSFETS, I.E.E.E. transactions on electron devices, 42(1), 1995, pp. 109-115

Authors: POMP HG KUIPER AET LIFKA H MONTREE AH WOERLEE PH

Citation: Hg. Pomp et al., LIGHTLY NITRIDED GATE OXIDES FOR 0.25 MU-M CMOS, Microelectronic engineering, 22(1-4), 1993, pp. 85-88

Authors: WALKER AJ WOERLEE PH POMP HG COWERN NEB

Citation: Aj. Walker et al., SHALLOW BORON JUNCTIONS AND PREAMORPHIZATION FOR DEEP SUBMICRON SILICON TECHNOLOGY, Journal of applied physics, 73(8), 1993, pp. 4048-4053