Authors: SCHOPKE A SELLE B SIEBER I REINSPERGER GU STAUSS P HERZ K POWALLA M

Citation: A. Schopke et al., CHARACTERIZATION OF THE STOICHIOMETRY OF COEVAPORATED FESIX FILMS BY AES, EDX, RES, AND ELECTRON-MICROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 322-325

Authors: HERZ K POWALLA M

Citation: K. Herz et M. Powalla, ELECTRICAL AND OPTICAL-PROPERTIES OF THIN BETA-FESI2 FILMS ON AL2O3 SUBSTRATES, Applied surface science, 91(1-4), 1995, pp. 87-92

Authors: HERZ K POWALLA M EICKE A

Citation: K. Herz et al., POLYCRYSTALLINE BETA-FESI2 THIN-FILMS ON NON-SILICON SUBSTRATES, Physica status solidi. a, Applied research, 145(2), 1994, pp. 415-424

Authors: POWALLA M HERZ K

Citation: M. Powalla et K. Herz, CRYSTALLIZATION OF COEVAPORATED BETA-FESI2 THIN-FILMS, Applied surface science, 70-1, 1993, pp. 593-597