Authors:
GRAFSTROM S
ACKERMANN J
HAGEN T
NEUMANN R
PROBST O
Citation: S. Grafstrom et al., ANALYSIS OF LATERAL FORCE EFFECTS ON THE TOPOGRAPHY IN SCANNING FORCEMICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1559-1564
Authors:
FREUND J
PROBST O
GRAFSTROM S
DEY S
KOWALSKI J
NEUMANN R
WORTGE M
ZUPUTLITZ G
Citation: J. Freund et al., SCANNING-TUNNELING-MICROSCOPY OF LIQUID-CRYSTALS, PERYLENE-TETRACARBOXYLIC-DIANHYDRIDE AND PHTHALOCYANINE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1914-1917
Authors:
PROBST O
GRAFSTROM S
FRITZ J
DEY S
KOWALSKI J
NEUMANN R
WORTGE M
PUTLITZ G
Citation: O. Probst et al., CONTRAST MECHANISMS IN PHOTOTHERMAL SCANNING-TUNNELING-MICROSCOPY, Applied physics. A, Solids and surfaces, 59(2), 1994, pp. 109-113