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SCANNING ELECTRON-MICROSCOPIC DETERMINATI ON OF LAYER THICKNESS IN NANOMETRIC HETEROSTRUCTURES OF NANOMETRIC GAAS-ALXGA1-XAS
Authors: PRUTSKIJ T SILVA R CHAVEZ F SILVAANDRADE F
Citation: T. Prutskij et al., SCANNING ELECTRON-MICROSCOPIC DETERMINATI ON OF LAYER THICKNESS IN NANOMETRIC HETEROSTRUCTURES OF NANOMETRIC GAAS-ALXGA1-XAS, Revista Mexicana de Fisica, 41(2), 1995, pp. 297-304
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