Authors:
JEYNES C
PUTTICK KE
WHITMORE LC
GARTNER K
GEE AE
MILLEN DK
WEBB RP
PEEL RMA
SEALY BJ
Citation: C. Jeynes et al., LATERALLY RESOLVED CRYSTALLINE DAMAGE IN SINGLE-POINT-DIAMOND-TURNED SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 431-436
Citation: Lw. Anson et al., ON THE FEASIBILITY OF DETECTING PRE-CRACKING FATIGUE DAMAGE IN METAL-MATRIX COMPOSITES BY ULTRASONIC TECHNIQUES, Composites science and technology, 55(1), 1995, pp. 63-73
Citation: Ke. Puttick et al., TRANSMISSION ELECTRON-MICROSCOPY OF NANOMACHINED SILICON-CRYSTALS, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 69(1), 1994, pp. 91-103