Authors:
Lee, SK
Zetterling, CM
Danielsson, E
Ostling, M
Palmquist, JP
Hogberg, H
Jansson, U
Citation: Sk. Lee et al., Electrical characterization of TiC ohmic contacts to aluminum ion implanted 4H-silicon carbide, APPL PHYS L, 77(10), 2000, pp. 1478-1480