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Gonzalez, JM
Prados, C
Salcedo, A
Pina, E
Palomares, FJ
Cebollada, F
Hernando, A
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Authors:
Palomares, FJ
Salcedo, A
Bernardi, J
Fidler, J
Hernando, A
Gonzalez, JM
Citation: Fj. Palomares et al., Layer thickness and magnetic relaxation properties in sputtered Co/Ni multilayers, J MAGN MAGN, 226, 2001, pp. 1792-1794
Authors:
Ynzunza, RX
Daimon, H
Palomares, FJ
Tober, ED
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Morais, J
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Kortright, JB
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Van Hove, MA
Fadley, CS
Citation: Rx. Ynzunza et al., Circular dichroism in core photoelectron emission from (1x1) oxygen on W(110): experiment and multiple-scattering theory, J ELEC SPEC, 106(1), 2000, pp. 7-28
Authors:
Ynzunza, RX
Denecke, R
Palomares, FJ
Morais, J
Tober, ED
Wang, Z
de Abajo, FJG
Liesegang, J
Hussain, Z
Van Hove, MA
Fadley, CS
Citation: Rx. Ynzunza et al., Kinetics and atomic structure of O adsorption on W(110) from time- and state-resolved photoelectron spectroscopy and full-solid-angle photoelectron diffraction, SURF SCI, 459(1-2), 2000, pp. 69-92
Authors:
Rojas, C
Palomares, FJ
Lopez, MF
Goldoni, A
Paolucci, G
Martin-Gago, JA
Citation: C. Rojas et al., Formation and stability of the Cu(110)+c(2x2)-Si surface alloy studied by high resolution XPS, SURF SCI, 454, 2000, pp. 778-782
Authors:
Quiros, C
Gomez-Garcia, J
Palomares, FJ
Soriano, L
Elizalde, E
Sanz, JM
Citation: C. Quiros et al., Correlation between N 1s core level x-ray photoelectron and x-ray absorption spectra of amorphous carbon nitride films, APPL PHYS L, 77(6), 2000, pp. 803-805
Authors:
Ynzunza, RX
Palomares, FJ
Tober, ED
Wang, Z
Morais, J
Denecke, R
Daimon, H
Chen, Y
Hussain, Z
Van Hove, MA
Fadley, CS
Citation: Rx. Ynzunza et al., Structure determination for saturated(1 x 1) oxygen on W(110) from full solid angle photoelectron diffraction with chemical-state resolution, SURF SCI, 442(1), 1999, pp. 27-35
Authors:
Ynzunza, RX
Tober, ED
Palomares, FJ
Wang, Z
Daimon, H
Kaduwela, AP
Chen, Y
Hussain, Z
Van Hove, MA
Fadley, CS
Citation: Rx. Ynzunza et al., Full solid angle photoelectron diffraction from bulk and surface atoms of clean W(110), SURF SCI, 441(2-3), 1999, pp. 301-310