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Results: 1-25 | 26-27 |
Results: 26-27/27
Experimental and theoretical investigation of nonvolatile memory data-retention
Authors: De Salvo, B Ghibaudo, G Pananakakis, G Reimbold, G Mondond, F Guillaumot, B Candelier, P
Citation: B. De Salvo et al., Experimental and theoretical investigation of nonvolatile memory data-retention, IEEE DEVICE, 46(7), 1999, pp. 1518-1524
Analysis of the stress-induced leakage current and related trap distribution
Authors: Riess, P Ghibaudo, G Pananakakis, G
Citation: P. Riess et al., Analysis of the stress-induced leakage current and related trap distribution, APPL PHYS L, 75(24), 1999, pp. 3871-3873
Risultati: 1-25 | 26-27 |