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Results: 2
Properties and mutual interactions of various acrylate monomers used in 193 nm resists
Authors:
Paniez, PJ Perrier, F Panabiere, M Mortini, B Rosilio, C
Citation:
Pj. Paniez et al., Properties and mutual interactions of various acrylate monomers used in 193 nm resists, MICROEL ENG, 46(1-4), 1999, pp. 393-396
Resist processes for hybrid (electron-beam deep ultraviolet) lithography
Authors:
Tedesco, S Mourier, T Dal'zotto, B McDougall, A Blanc-Coquant, S Quere, Y Paniez, PJ Mortini, B
Citation:
S. Tedesco et al., Resist processes for hybrid (electron-beam deep ultraviolet) lithography, J VAC SCI B, 16(6), 1998, pp. 3676-3683
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