Authors:
Zhi, D
Davock, H
Murray, R
Roberts, C
Jones, TS
Pashley, DW
Goodhew, PJ
Joyce, BA
Citation: D. Zhi et al., Quantitative compositional analysis of InAs/GaAs quantum dots by scanning transmission electron microscopy, J APPL PHYS, 89(4), 2001, pp. 2079-2083
Citation: Jg. Belk et al., Dislocation displacement field at the surface of InAs thin films grown on GaAs(110), PHYS REV B, 58(24), 1998, pp. 16194-16201