Authors: Raghavan, V Shakeri, M Pattipati, K

Citation: V. Raghavan et al., Test sequencing algorithms with unreliable tests, IEEE SYST A, 29(4), 1999, pp. 347-357

Authors: Raghavan, V Shakeri, M Pattipati, K

Citation: V. Raghavan et al., Optimal and near-optimal test sequencing algorithms with realistic test models, IEEE SYST A, 29(1), 1999, pp. 11-26

Authors: Pattipati, K Hall, LO

Citation: K. Pattipati et Lo. Hall, Launching electronic version of the IEEE Transactions on Systems, Man, andCybernetics - Part B, IEEE SYST B, 29(6), 1999, pp. 673-673