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Results:
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Results: 3
Test sequencing algorithms with unreliable tests
Authors:
Raghavan, V Shakeri, M Pattipati, K
Citation:
V. Raghavan et al., Test sequencing algorithms with unreliable tests, IEEE SYST A, 29(4), 1999, pp. 347-357
Optimal and near-optimal test sequencing algorithms with realistic test models
Authors:
Raghavan, V Shakeri, M Pattipati, K
Citation:
V. Raghavan et al., Optimal and near-optimal test sequencing algorithms with realistic test models, IEEE SYST A, 29(1), 1999, pp. 11-26
Launching electronic version of the IEEE Transactions on Systems, Man, andCybernetics - Part B
Authors:
Pattipati, K Hall, LO
Citation:
K. Pattipati et Lo. Hall, Launching electronic version of the IEEE Transactions on Systems, Man, andCybernetics - Part B, IEEE SYST B, 29(6), 1999, pp. 673-673
Risultati:
1-3
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