Authors: Kuz'menko, RV Ganzha, AV Bochurova, OV Domashevskaya, EP Schreiber, J Hildebrandt, S Mo, S Peiner, E Schlachetzki, A

Citation: Rv. Kuz'Menko et al., Temperature dependence of residual stress in epitaxial GaAs/Si(100) films determined from photoreflectance spectroscopy data, SEMICONDUCT, 34(1), 2000, pp. 73-80

Authors: Harms, U Klose, F Neuhauser, H Fricke, K Peiner, E Schlachetzki, A

Citation: U. Harms et al., Anelastic properties of aluminium thin films on silicon cantilevers, J ALLOY COM, 310, 2000, pp. 449-453

Authors: Peiner, E Fricke, K Behrens, I Bakin, A Schlachetzki, A

Citation: E. Peiner et al., Hetero-micromachining of epitaxial III/V compound semiconductors, SENS ACTU-A, 85(1-3), 2000, pp. 324-329

Authors: Kuz'menko, RV Ganzha, AV Bochurova, OV Domashevskaya, EP Schreiber, J Hildebrandt, S Mo, S Peiner, E

Citation: Rv. Kuz'Menko et al., Strain-induced photoreflectance spectra in the vicinity of the E-0 transition in GaAs/Si and InP/Si heterostructures, PHYS SOL ST, 41(4), 1999, pp. 654-659

Authors: Peiner, E Mikuta, R Iwert, T Fritsch, H Hauptmann, P Fricke, K Schlachetzki, A

Citation: E. Peiner et al., Micromachined resonator for cavitation sensing, SENS ACTU-A, 76(1-3), 1999, pp. 266-272

Authors: Fricke, K Peiner, E Chahoud, M Schlachetzki, A

Citation: K. Fricke et al., Fractures properties of InP microcantilevers by hetero-micromachining, SENS ACTU-A, 76(1-3), 1999, pp. 395-402