Authors: Peiser, HS

Citation: Hs. Peiser, Measurement science at the national bureau of standards, ACCRED Q A, 6(3), 2001, pp. 111-112

Authors: De Bievre, P Valkiers, S Kessel, R Taylor, PDP Becker, P Bettin, H Peuto, A Pettorruso, S Fujii, K Waseda, A Tanaka, M Deslattes, RD Peiser, HS Kenny, MJ

Citation: P. De Bievre et al., A reassessment of the molar volume of silicon and of the Avogadro constant, IEEE INSTR, 50(2), 2001, pp. 593-597

Authors: Peiser, HS De Bievre, P

Citation: Hs. Peiser et P. De Bievre, Traceability in measurement - time for an update?, ACCRED Q A, 4(4), 1999, pp. 154-155