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Results: 4
Optical properties of partially damaged ion implanted SiC layers by use ofeffective medium models
Authors:
Wendler, E Peiter, G
Citation:
E. Wendler et G. Peiter, Optical properties of partially damaged ion implanted SiC layers by use ofeffective medium models, J APPL PHYS, 87(11), 2000, pp. 7679-7684
Vibrational spectroscopy of SiC thin films deposited by excimer laser ablation
Authors:
Hobert, H Dunken, HH Peiter, G Stier, W Diegel, M Stafast, H
Citation:
H. Hobert et al., Vibrational spectroscopy of SiC thin films deposited by excimer laser ablation, APPL PHYS A, 69(1), 1999, pp. 69-76
Ion beam processing of SiC for optical application
Authors:
Wesch, W Heft, A Menzel, R Bachmann, T Peiter, G Hobert, H Hoche, T Dannberg, P Brauer, A
Citation:
W. Wesch et al., Ion beam processing of SiC for optical application, NUCL INST B, 148(1-4), 1999, pp. 545-550
Infrared properties of SiC particles
Authors:
Mutschke, H Andersen, AC Clement, D Henning, T Peiter, G
Citation:
H. Mutschke et al., Infrared properties of SiC particles, ASTRON ASTR, 345(1), 1999, pp. 187-202
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