Authors: Wonhrath, K Mello, SV Pereira-da-Silva, MA Oliveira, ON

Citation: K. Wonhrath et al., Langmuir-Blodgett films of ruthenium phosphine complexes characterized by Atomic Force Microscopy, SYNTH METAL, 121(1-3), 2001, pp. 1425-1426

Authors: Pontes, FM Araujo, EB Leite, ER Eiras, JA Longo, E Varela, JA Pereira-da-Silva, MA

Citation: Fm. Pontes et al., Microstructure and dielectric properties of (Ba,Sr)TiO3 thin film producedby the polymeric precursor method, J MATER RES, 15(5), 2000, pp. 1176-1181

Authors: Constantino, CJL Dhanabalan, A Cotta, MA Pereira-da-Silva, MA Curvelo, AAS Oliveira, ON

Citation: Cjl. Constantino et al., Atomic force microscopy (AFM) investigation of Langmuir-Blodgett (LB) films of sugar cane bagasse lignin, HOLZFORSCH, 54(1), 2000, pp. 55-60

Authors: Lobo, RFM Pereira-da-Silva, MA Raposo, M Faria, RM Oliveira, ON

Citation: Rfm. Lobo et al., In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy, NANOTECHNOL, 10(4), 1999, pp. 389-393

Authors: Mendonca, CR Dhanabalan, A Balogh, DT Misoguti, L dos Santos, DS Pereira-da-Silva, MA Giacometti, JA Zilio, SC Oliveira, ON

Citation: Cr. Mendonca et al., Optically induced birefringence and surface relief gratings in composite Langmuir-Blodgett (LB) films of poly[4 '-[[2-(methacryloyloxy)ethyl]ethylamino]-2-chloro-4-nitroazobenzene] (HPDR13) and cadmium stearate, MACROMOLEC, 32(5), 1999, pp. 1493-1499