Citation: Wh. Rippard et al., Ballistic current transport studies of ferromagnetic multilayer films and tunnel junctions (invited), J APPL PHYS, 89(11), 2001, pp. 6642-6646
Citation: Wh. Rippard et al., Ballistic electron microscopy study of ultrathin oxidized aluminum barriers for magnetic tunnel junctions, APPL PHYS L, 78(11), 2001, pp. 1601-1603
Authors:
Rippard, WH
Perrella, AC
Chalsani, P
Albert, FJ
Katine, JA
Buhrman, RA
Citation: Wh. Rippard et al., Observation of magnetization reversal of thin-film permalloy nanostructures using ballistic electron magnetic microscopy, APPL PHYS L, 77(9), 2000, pp. 1357-1359