Authors: Persheyev, SK Goldie, DM Gibson, RAG Rose, MJ Anthony, S Keeble, DJ Robb, K Main, C Reynolds, S Zrinscak, I

Citation: Sk. Persheyev et al., Depth profiling and the effect of oxygen and carbon on the photoelectricalproperties of amorphous silicon films deposited using tungsten wire filaments, THIN SOL FI, 395(1-2), 2001, pp. 130-133