Authors: Iannuzzo, F Persiano, GV Busatto, G

Citation: F. Iannuzzo et al., Measurement of the BJT activation current during the reverse recovery of power MOSFET's drain-source diode, IEEE DEVICE, 48(2), 2001, pp. 391-393

Authors: Busatto, G Persiano, GV Iannuzzo, F

Citation: G. Busatto et al., Experimental and numerical investigation on MOSFET's failure during reverse recovery of its internal diode, IEEE DEVICE, 46(6), 1999, pp. 1268-1273