Authors: McCaffrey, JP Phaneuf, MW Madsen, LD

Citation: Jp. Mccaffrey et al., Surface damage formation during ion-beam thinning of samples for transmission electron microscopy, ULTRAMICROS, 87(3), 2001, pp. 97-104

Authors: Wang, YZ Revie, RW Phaneuf, MW Li, J

Citation: Yz. Wang et al., Application of focused ion beam (FIB) microscopy to the study of crack profiles, FATIG FRACT, 22(3), 1999, pp. 251-256

Authors: Phaneuf, MW

Citation: Mw. Phaneuf, Applications of focused ion beam microscopy to materials science specimens, MICRON, 30(3), 1999, pp. 277-288

Authors: Botton, GA Phaneuf, MW

Citation: Ga. Botton et Mw. Phaneuf, Imaging, spectroscopy and spectroscopic imaging with an energy filtered field emission TEM, MICRON, 30(2), 1999, pp. 109-119

Authors: Evans, RD Phaneuf, MW Boyd, JD

Citation: Rd. Evans et al., Imaging damage evolution in a small particle metal matrix composite, J MICROSC O, 196, 1999, pp. 146-154