Authors:
Dharmadhikari, CV
Ali, AO
Suresh, N
Phase, DM
Chaudhari, SM
Gupta, A
Dasannacharya, BA
Citation: Cv. Dharmadhikari et al., A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering, MAT SCI E B, 75(1), 2000, pp. 29-37
Authors:
Suresh, N
Phase, DM
Gupta, A
Chaudhari, SM
Citation: N. Suresh et al., Electron density fluctuations at interfaces in Nb/Si bilayer, trilayer, and multilayer films: An x-ray reflectivity study, J APPL PHYS, 87(11), 2000, pp. 7946-7958