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Results:
1-3
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Results: 3
A sample scanning system with nanometric accuracy for quantitative SPM measurements
Authors:
Picotto, GB Pisani, M
Citation:
Gb. Picotto et M. Pisani, A sample scanning system with nanometric accuracy for quantitative SPM measurements, ULTRAMICROS, 86(1-2), 2001, pp. 247-254
The IMGC calibration setup for microdisplacement actuators
Authors:
Sacconi, A Picotto, GB Pasin, W
Citation:
A. Sacconi et al., The IMGC calibration setup for microdisplacement actuators, IEEE INSTR, 48(2), 1999, pp. 483-487
Vickers hardness indentations measured with atomic force microscopy
Authors:
Jensen, CP Jorgensen, JF Garnaes, J Picotto, GB Gori, C
Citation:
Cp. Jensen et al., Vickers hardness indentations measured with atomic force microscopy, J TEST EVAL, 26(6), 1998, pp. 532-538
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