Authors: Ramdani, J Droopad, R Yu, Z Curless, JA Overgaard, CD Finder, J Eisenbeiser, K Hallmark, JA Ooms, WJ Kaushik, V Alluri, P Pietambaram, S

Citation: J. Ramdani et al., Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy, APPL SURF S, 159, 2000, pp. 127-133