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Results: 1-8 |
Results: 8
On transition temperatures in the plasticity and fracture of semiconductors
Authors: Pirouz, P Demenet, JL Hong, MH
Citation: P. Pirouz et al., On transition temperatures in the plasticity and fracture of semiconductors, PHIL MAG A, 81(5), 2001, pp. 1207-1227
Deformation-induced dislocations in 15R-SiC grown by sublimation
Authors: Hong, MH Pirouz, P Chung, J Yoon, SY Demenet, JL Nishiguchi, T Nishino, S
Citation: Mh. Hong et al., Deformation-induced dislocations in 15R-SiC grown by sublimation, PHIL MAG L, 81(12), 2001, pp. 823-831
Observation of 4H-SiC to 3C-SiC polytypic transformation during oxidation
Authors: Okojie, RS Xhang, M Pirouz, P Tumakha, S Jessen, G Brillson, LJ
Citation: Rs. Okojie et al., Observation of 4H-SiC to 3C-SiC polytypic transformation during oxidation, APPL PHYS L, 79(19), 2001, pp. 3056-3058
Stacking fault energy of 6H-SiC and 4H-SiC single crystals
Authors: Hong, MH Samant, AV Pirouz, P
Citation: Mh. Hong et al., Stacking fault energy of 6H-SiC and 4H-SiC single crystals, PHIL MAG A, 80(4), 2000, pp. 919-935
Plastic behavior of 4H-SiC single crystals deformed at low strain rates
Authors: Demenet, JL Hong, MH Pirouz, P
Citation: Jl. Demenet et al., Plastic behavior of 4H-SiC single crystals deformed at low strain rates, SCR MATER, 43(9), 2000, pp. 865-870
The relationship between activation parameters and dislocation glide in 4H-SiC single crystals
Authors: Samant, AV Hong, MH Pirouz, P
Citation: Av. Samant et al., The relationship between activation parameters and dislocation glide in 4H-SiC single crystals, PHYS ST S-B, 222(1), 2000, pp. 75-93
On temperature dependence of deformation mechanism and the brittle-ductiletransition in semiconductors
Authors: Pirouz, P Samant, AV Hong, MH Moulin, A Kubin, LP
Citation: P. Pirouz et al., On temperature dependence of deformation mechanism and the brittle-ductiletransition in semiconductors, J MATER RES, 14(7), 1999, pp. 2783-2793
High temperature ohmic contacts to 3C-silicon carbide films
Authors: Jacob, C Pirouz, P Kuo, HI Mehregany, M
Citation: C. Jacob et al., High temperature ohmic contacts to 3C-silicon carbide films, SOL ST ELEC, 42(12), 1998, pp. 2329-2334
Risultati: 1-8 |