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Results: 1-10 |
Results: 10
Dispersive characteristics of diamond in the range of hard x-ray waves
Authors: Tour'yanskii, AG Pirshin, IV Khmel'nitskii, RA Gippius, AA
Citation: Ag. Tour'Yanskii et al., Dispersive characteristics of diamond in the range of hard x-ray waves, PHYS SOL ST, 43(4), 2001, pp. 644-651
X-ray spectrum determination from the angular dispersion of radiation in adiamond prism
Authors: Tur'yanskii, AG Pirshin, IV Khmel'nitskii, RA Gippius, AA
Citation: Ag. Tur'Yanskii et al., X-ray spectrum determination from the angular dispersion of radiation in adiamond prism, JETP LETTER, 73(9), 2001, pp. 457-460
An X-ray refractometer
Authors: Touryanskii, AG Pirshin, IV
Citation: Ag. Touryanskii et Iv. Pirshin, An X-ray refractometer, INSTR EXP R, 44(2), 2001, pp. 232-239
Optical properties of semiconductor nanoparticles
Authors: Melnik, NN Burbayev, TM Zavaritskaya, TN Kurbatov, VA Malahov, KV Pirshin, IV Rzaev, MM Turianskii, AG Karavanskii, VA
Citation: Nn. Melnik et al., Optical properties of semiconductor nanoparticles, IAN FIZ, 64(2), 2000, pp. 281-283
Two-channel X-ray reflectometer
Authors: Touryanski, AG Vinogradov, AV Pirshin, IV
Citation: Ag. Touryanski et al., Two-channel X-ray reflectometer, NUCL INST A, 448(1-2), 2000, pp. 184-187
Application of the statistical dynamical theory of X-ray diffraction to calculation of the HOPG echelon-monochromator parameters
Authors: Nesterets, YI Punegov, VI Pirshin, IV Touryanski, AG Vinogradov, AV Foster, E Podorov, SG
Citation: Yi. Nesterets et al., Application of the statistical dynamical theory of X-ray diffraction to calculation of the HOPG echelon-monochromator parameters, PHYS ST S-A, 179(2), 2000, pp. 311-317
A method for the formation of ultrathin X-ray beams
Authors: Touryanskii, AG Pirshin, IV
Citation: Ag. Touryanskii et Iv. Pirshin, A method for the formation of ultrathin X-ray beams, INSTR EXP R, 43(5), 2000, pp. 664-670
A grid-type semitransparent X-ray monochromator
Authors: Touryanskii, AG Pirshin, IV
Citation: Ag. Touryanskii et Iv. Pirshin, A grid-type semitransparent X-ray monochromator, INSTR EXP R, 43(4), 2000, pp. 542-546
X-ray refractometry of surface layers
Authors: Tour'yanski, AG Pirshin, IV
Citation: Ag. Tour'Yanski et Iv. Pirshin, X-ray refractometry of surface layers, INSTR EXP R, 42(6), 1999, pp. 827-834
A two-wave X-ray reflectometer
Authors: Tur'yanskii, AG Vinogradov, AV Pirshin, IV
Citation: Ag. Tur'Yanskii et al., A two-wave X-ray reflectometer, INSTR EXP R, 42(1), 1999, pp. 94-99
Risultati: 1-10 |