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Results:
1-15
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Results: 15
Authors:
Liu, KW
Mucklich, F
Pitschke, W
Birringer, R
Wetzig, K
Citation: Kw. Liu et al., Formation of nanocrystalline B2-structured (Ru,Ni)Al in the ternary Ru-Al-Ni system by mechanical alloying and its thermal stability, MAT SCI E A, 313(1-2), 2001, pp. 187-197
Authors:
Liu, KW
Mucklich, F
Pitschke, W
Birringer, R
Wetzig, K
Citation: Kw. Liu et al., Synthesis of nanocrystalline B2 structured (Ru, Ir) Al in the ternary Ru-Al-Ir system by mechanical alloying and its thermal stability, Z METALLKUN, 92(8), 2001, pp. 924-930
Authors:
Pitschke, W
Hofman, D
Schumann, J
Kleint, CA
Heinrich, A
Burkov, AT
Citation: W. Pitschke et al., Structure of nanocrystalline Re-Si thin film composites and their unusual thermoelectric properties, J APPL PHYS, 89(6), 2001, pp. 3229-3241
Authors:
Bruckner, W
Weihnacht, V
Pitschke, W
Thomas, J
Baunack, S
Citation: W. Bruckner et al., Abnormal grain growth of sputtered CuNi(Mn) thin films, J MATER RES, 15(5), 2000, pp. 1062-1068
Authors:
Pitschke, W
Kurt, R
Heinrich, A
Schumann, J
Griessmann, H
Vinzelberg, H
Burkov, AT
Citation: W. Pitschke et al., Structure and thermoelectric properties of binary and Fe-doped iridium silicide thin films, J MATER RES, 15(3), 2000, pp. 772-782
Authors:
Zeiger, W
Bruckner, W
Schumann, J
Pitschke, W
Worch, H
Citation: W. Zeiger et al., Stress development in FeAl8 thin films during heat treatment, THIN SOL FI, 370(1-2), 2000, pp. 315-320
Authors:
Pitschke, W
Werner, J
Behr, G
Koumoto, K
Citation: W. Pitschke et al., Structure and thermoelectric properties of Me-substituted In4Sn3O12, Me = Y and Ti, J SOL ST CH, 153(2), 2000, pp. 349-356
Authors:
Masuda, Y
Ohta, M
Seo, WS
Pitschke, W
Koumoto, K
Citation: Y. Masuda et al., Structure and thermoelectric transport properties of isoelectronically substituted (ZnO)(5)In2O3, J SOL ST CH, 150(1), 2000, pp. 221-227
Authors:
Bruckner, W
Pitschke, W
Thomas, J
Leitner, G
Citation: W. Bruckner et al., Stress, resistance, and phase transitions in NiCr(60 wt%) thin films, J APPL PHYS, 87(5), 2000, pp. 2219-2226
Authors:
Kurt, R
Hoffmann, V
Reiche, R
Pitschke, W
Wetzig, K
Citation: R. Kurt et al., Chemical analysis of thin films by means of SS-MS, GD-OES, and XBS demonstrated at Ir-Si thermoelectrica, FRESEN J AN, 363(2), 1999, pp. 179-184
Authors:
Pitschke, W
Koumoto, K
Citation: W. Pitschke et K. Koumoto, Powder diffraction data and Rietveld refinement for Y-doped (ZnO)(5)In2O3, POWDER DIFF, 14(3), 1999, pp. 213-218
Authors:
Bruckner, W
Pitschke, W
Baunack, S
Thomas, J
Citation: W. Bruckner et al., Mechanical stress, grain-boundary relaxation, and oxidation of sputtered CuNi(Mn) films, J MATER RES, 14(4), 1999, pp. 1286-1294
Authors:
Endler, I
Leonhardt, A
Konig, U
van den Berg, H
Pitschke, W
Sottke, V
Citation: I. Endler et al., Chemical vapour deposition of MoS2 coatings using the precursors MoCl5 andH2S, SURF COAT, 121, 1999, pp. 482-488
Authors:
Baunack, S
Bruckner, W
Pitschke, W
Thomas, J
Citation: S. Baunack et al., Auger electron spectroscopy study of interdiffusion, oxidation and segregation during thermal treatment of NiCr/CuNi(Mn)/NiCr thin films, APPL SURF S, 145, 1999, pp. 216-221
Authors:
Koumoto, K
Hiramatsu, H
Seo, WS
Pitschke, W
Citation: K. Koumoto et al., Electronic properties of transparentconductive oxides in the ZnO-In2O3 system, RRD APP PHY, 2, 1999, pp. 255-267
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