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Results: 4

Authors: Poilane, C Lantz, E Tribillon, G Delobelle, P
Citation: C. Poilane et al., Measurement of in-plane displacement fields by a spectral phase algorithm applied to numerical speckle photography for microtensile tests, EPJ-APPL PH, 11(2), 2000, pp. 131-145

Authors: Poilane, C Delobelle, P Lexcellent, C Hayashi, S Tobushi, H
Citation: C. Poilane et al., Analysis of the mechanical behavior of shape memory polymer membranes by nanoindentation, bulging and point membrane deflection tests, THIN SOL FI, 379(1-2), 2000, pp. 156-165

Authors: Moyne, S Poilane, C Kitamura, K Miyazaki, S Delobelle, P Lexcellent, C
Citation: S. Moyne et al., Analysis of the thermomechanical behavior of Ti-Ni shape memory alloy thinfilms by bulging and nanoindentation procedures, MAT SCI E A, 275, 1999, pp. 727-732

Authors: Poilane, C Delobelle, P Bornier, L Mounaix, P Melique, X Lippens, D
Citation: C. Poilane et al., Determination of the mechanical properties of thin polyimide films deposited on a GaAs substrate by bulging and nanoindentation tests, MAT SCI E A, 262(1-2), 1999, pp. 101-106
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