Authors:
Poilane, C
Lantz, E
Tribillon, G
Delobelle, P
Citation: C. Poilane et al., Measurement of in-plane displacement fields by a spectral phase algorithm applied to numerical speckle photography for microtensile tests, EPJ-APPL PH, 11(2), 2000, pp. 131-145
Authors:
Poilane, C
Delobelle, P
Lexcellent, C
Hayashi, S
Tobushi, H
Citation: C. Poilane et al., Analysis of the mechanical behavior of shape memory polymer membranes by nanoindentation, bulging and point membrane deflection tests, THIN SOL FI, 379(1-2), 2000, pp. 156-165
Authors:
Moyne, S
Poilane, C
Kitamura, K
Miyazaki, S
Delobelle, P
Lexcellent, C
Citation: S. Moyne et al., Analysis of the thermomechanical behavior of Ti-Ni shape memory alloy thinfilms by bulging and nanoindentation procedures, MAT SCI E A, 275, 1999, pp. 727-732
Authors:
Poilane, C
Delobelle, P
Bornier, L
Mounaix, P
Melique, X
Lippens, D
Citation: C. Poilane et al., Determination of the mechanical properties of thin polyimide films deposited on a GaAs substrate by bulging and nanoindentation tests, MAT SCI E A, 262(1-2), 1999, pp. 101-106