Authors: Polgar, O Fried, M Lohner, T Barsony, I

Citation: O. Polgar et al., A combined topographical search strategy with ellipsometric application, J GLOB OPT, 19(4), 2001, pp. 383-401

Authors: Lohner, T Fried, M Petrik, P Polgar, O Gyulai, J Lehnert, W

Citation: T. Lohner et al., Ellipsometric characterization of oxidized porous silicon layer structures, MAT SCI E B, 69, 2000, pp. 182-187

Authors: Polgar, O Fried, M Lohner, T Barsony, I

Citation: O. Polgar et al., Comparison of algorithms used for evaluation of ellipsometric measurements- Random search, genetic algorithms, simulated annealing and hill climbinggraph-searches, SURF SCI, 457(1-2), 2000, pp. 157-177

Authors: Strehlke, S Bastide, S Polgar, O Fried, M",Levy-Clement

Citation: S. Strehlke et al., Characterization of thin porous silicon films formed on n(+)/p silicon junctions by spectroscopic ellipsometry, J ELCHEM SO, 147(2), 2000, pp. 636-641

Authors: Petrik, P Lohner, T Fried, M Khanh, NQ Polgar, O Gyulai, J

Citation: P. Petrik et al., Comparative study of ion implantation caused damage depth profiles in polycrystalline and single crystalline silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry, NUCL INST B, 147(1-4), 1999, pp. 84-89

Authors: Fried, M Polgar, O Lohner, T Strehlke, S Levy-Clement, C

Citation: M. Fried et al., Comparative study of the oxidation of thin porous silicon layers studied by reflectometry, spectroscopic ellipsometry and secondary ion mass spectroscopy, J LUMINESC, 80(1-4), 1998, pp. 147-152