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Results:
1-8
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Results: 8
Authors:
Poliski, I
Citation: I. Poliski, Finding-and keeping-technical staff, R&D MAG, 2001, pp. 25-25
Authors:
Poliski, I
Citation: I. Poliski, Thin film is what you make it. New angles on deposition, R&D MAG, 43(8), 2001, pp. 26-33
Authors:
Poliski, I
Citation: I. Poliski, CVD integrates inorganics, R&D MAG, 43(7), 2001, pp. 19-21
Authors:
Poliski, I
Citation: I. Poliski, Testing ultra-thin films non-destructively, R&D MAG, 43(7), 2001, pp. 29-31
Authors:
Poliski, I
Citation: I. Poliski, Surroundings take on new laboratory role, R&D MAG, 43(5), 2001, pp. L17-L19
Authors:
Poliski, I
Citation: I. Poliski, Monitoring thin-film deposition: The workhorse sensor crystal, R&D MAG, 43(4), 2001, pp. 33-33
Authors:
Poliski, I
Citation: I. Poliski, Gate-based system tracks product development - Metrics and evaluation testproduct viability and determine odds for success., R&D MAG, 43(10), 2001, pp. 15-15
Authors:
Poliski, I
Citation: I. Poliski, Compressor basics, reviewing the options - Workhorses that move air for myriad applications offer technological variations and have come to accommodate market-driven requirements - both environmental and practical., R&D MAG, 43(10), 2001, pp. 29-29
Risultati:
1-8
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