Authors:
Pritzkow, W
Vogl, J
Berger, A
Ecker, K
Grotzschel, R
Klingbeil, P
Persson, L
Riebe, G
Watjen, U
Citation: W. Pritzkow et al., Contribution of ICP-IDMS to the certification of antimony implanted in a silicon wafer - comparison with RBS and INAA results, FRESEN J AN, 371(6), 2001, pp. 867-873
Authors:
Wermann, G
Alber, D
Pritzkow, W
Riebe, G
Gorner, W
Citation: G. Wermann et al., Characterization of neutron transmuted zinc traces in pure copper materials by isotope dilution mass spectrometry, FRESEN J AN, 370(5), 2001, pp. 606-611
Authors:
Klingbeil, P
Vogl, J
Pritzkow, W
Riebe, G
Muller, J
Citation: P. Klingbeil et al., Comparative studies on the certification of reference materials by ICPMS and TIMS using isotope dilution procedures, ANALYT CHEM, 73(8), 2001, pp. 1881-1888