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Authors: Pritzkow, W Vogl, J Berger, A Ecker, K Grotzschel, R Klingbeil, P Persson, L Riebe, G Watjen, U
Citation: W. Pritzkow et al., Contribution of ICP-IDMS to the certification of antimony implanted in a silicon wafer - comparison with RBS and INAA results, FRESEN J AN, 371(6), 2001, pp. 867-873

Authors: Wermann, G Alber, D Pritzkow, W Riebe, G Gorner, W
Citation: G. Wermann et al., Characterization of neutron transmuted zinc traces in pure copper materials by isotope dilution mass spectrometry, FRESEN J AN, 370(5), 2001, pp. 606-611

Authors: Klingbeil, P Vogl, J Pritzkow, W Riebe, G Muller, J
Citation: P. Klingbeil et al., Comparative studies on the certification of reference materials by ICPMS and TIMS using isotope dilution procedures, ANALYT CHEM, 73(8), 2001, pp. 1881-1888
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