Authors:
TEOWEE G
BAERTLEIN CD
SIMPSON JT
ZHAO TJ
MANSURIPUR M
QUACKENBUSH EL
BOULTON JM
UHLMANN DR
Citation: G. Teowee et al., MEASUREMENT OF ELECTROOPTIC PROPERTIES OF FERROELECTRIC THIN-FILMS USING THE ULTIMATE ELLIPSOMETER, Integrated ferroelectrics, 11(1-4), 1995, pp. 69-80
Authors:
TEOWEE G
MEBES MP
BAERTLEIN CD
QUACKENBUSH EL
KNEER EA
BOULTON JM
UHLMANN DR
Citation: G. Teowee et al., COMPOSITIONAL TAILORING OF THE DIELECTRIC AND FERROELECTRIC PROPERTIES OF SOL-GEL DERIVED PLZT THIN-FILMS, Integrated ferroelectrics, 10(1-4), 1995, pp. 131-143