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Results:
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Results: 4
Neutron irradiation damage to boron carbide: X-ray diffraction analysis
Authors:
Gosset, D Simeone, D Quirion, D
Citation:
D. Gosset et al., Neutron irradiation damage to boron carbide: X-ray diffraction analysis, J PHYS IV, 10(P10), 2000, pp. 55-63
Proximity effect in a planar superconductor/semiconductor junction
Authors:
Lefloch, F Quirion, D Sanquer, M
Citation:
F. Lefloch et al., Proximity effect in a planar superconductor/semiconductor junction, PHYSICA B, 284, 2000, pp. 1846-1847
Proximity effect in planar TiN-silicon junctions
Authors:
Quirion, D Lefloch, F Sanquer, M
Citation:
D. Quirion et al., Proximity effect in planar TiN-silicon junctions, J L TEMP PH, 120(5-6), 2000, pp. 361-380
Study of B4C microstructure evolution under neutron irradiation by X-ray diffraction profiles analysis
Authors:
Simeone, D Gosset, D Quirion, D Deschanels, X
Citation:
D. Simeone et al., Study of B4C microstructure evolution under neutron irradiation by X-ray diffraction profiles analysis, J NUCL MAT, 264(3), 1999, pp. 295-308
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