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Authors: RADING D LIEBING V BECKER G FUCHS H BENNINGHOVEN A
Citation: D. Rading et al., INVESTIGATION OF ELECTRON-INDUCED DAMAGING OF MOLECULAR OVERLAYERS BYIMAGING STATIC SECONDARY-ION MASS-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3449-3454

Authors: BENNINGHOVEN A RADING D
Citation: A. Benninghoven et D. Rading, SURFACE-ANALYSIS OF POLYMER MATERIALS BY SECONDARY-ION MASS-SPECTROMETRY, Macromolecular symposia, 83, 1994, pp. 27-36

Authors: LEUTE A RADING D BENNINGHOVEN A SCHROEDER K KLEE D
Citation: A. Leute et al., STATIC SIMS INVESTIGATION OF IMMOBILIZED MOLECULES ON POLYMER SURFACES, Advanced materials, 6(10), 1994, pp. 775-780

Authors: FELD H RADING D LEUTE A BENNINGHOVEN A
Citation: H. Feld et al., COMPARATIVE INVESTIGATIONS OF THE SECONDARY-ION EMISSION OF METAL-COMPLEXES UNDER MEV AND KEV ION-BOMBARDMENT, Organic mass spectrometry, 28(8), 1993, pp. 841-852

Authors: FELD H LEUTE A RADING D BENNINGHOVEN A CHIARELLI MP HERCULES DM
Citation: H. Feld et al., SECONDARY-ION EMISSION FROM PERFLUORINATED POLYETHERS USING MEGAELECTRONVOLT AND KILOELECTRONVOLT ION-BOMBARDMENT, Analytical chemistry, 65(15), 1993, pp. 1947-1953
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