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Results: 1-4 |
Results: 4

Authors: CHITTIPEDDI S KANNAN VC RAMBABU B
Citation: S. Chittipeddi et al., INTEGRITY OF SHALLOW JUNCTION CMOS STRUCTURES WITH TI TIN/AL-SI-CU AND TI/TIN/AL-CU CONTACT METALLIZATION/, Solid-state electronics, 38(12), 1995, pp. 2035-2040

Authors: SUNDAHL MJ IRWIN RB NANDA A WILKINS CW RAMBABU B
Citation: Mj. Sundahl et al., CONTAMINATIONS AND IMPURITIES IN DC MAGNETRON-SPUTTERED WSIX FILMS ONSIO2 - AN ANALYTICAL STUDY, Physica status solidi. a, Applied research, 147(2), 1995, pp. 477-490

Authors: CHITTIPEDDI S DZIUBA CM KANNAN VC KELLY MJ COCHRAN WT RAMBABU B
Citation: S. Chittipeddi et al., EFFECT OF RAPID THERMALLY NITRIDED TITANIUM FILMS CONTACTING SILICIDED AND NONSILICIDED JUNCTIONS, Journal of electronic materials, 22(7), 1993, pp. 785-791

Authors: CHITTIPEDDI S KELLY MJ VELAGA AN KANNAN VC DZIUBA CM COCHRAN WT RAMBABU B
Citation: S. Chittipeddi et al., EFFECT OF DOPANTS ON THE THERMAL-PROCESSING OF SALICIDED (TITANIUM DISALICIDED) CMOS STRUCTURES, Semiconductor science and technology, 8(11), 1993, pp. 2023-2029
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