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Results: 1-9 |
Results: 9
FABRICATION OF REGULAR 3-DIMENSIONAL LATTICES OF SUBMICRON SILICON CLUSTERS IN AN SIO2 OPAL MATRIX
Authors: BOGOMOLOV VN GOLUBEV VG KARTENKO NF KURDYUKOV DA PEVTSOV AB PROKOFEV AV RATNIKOV VV FEOKTISTOV NA SHARENKOVA NV
Citation: Vn. Bogomolov et al., FABRICATION OF REGULAR 3-DIMENSIONAL LATTICES OF SUBMICRON SILICON CLUSTERS IN AN SIO2 OPAL MATRIX, Technical physics letters, 24(4), 1998, pp. 326-327
IN AND SI DISTRIBUTION IN SYNTHETIC OPALS
Authors: RATNIKOV VV KURDYUKOV DA SOROKIN LM
Citation: Vv. Ratnikov et al., IN AND SI DISTRIBUTION IN SYNTHETIC OPALS, Physics of the solid state, 40(7), 1998, pp. 1249-1251
X-RAY MONITORING OF THE FILLING OF CLUSTER LATTICES IN SYNTHETIC OPALS
Authors: RATNIKOV VV
Citation: Vv. Ratnikov, X-RAY MONITORING OF THE FILLING OF CLUSTER LATTICES IN SYNTHETIC OPALS, Technical physics letters, 23(7), 1997, pp. 498-499
DETERMINING THE POROSITY OF SYNTHETIC OPALS AND POROUS SILICON BY X-RAY-METHODS
Authors: RATNIKOV VV
Citation: Vv. Ratnikov, DETERMINING THE POROSITY OF SYNTHETIC OPALS AND POROUS SILICON BY X-RAY-METHODS, Physics of the solid state, 39(5), 1997, pp. 856-858
STRUCTURE AND PROPERTIES OF POROUS SILICON OBTAINED BY PHOTOANODIZATION
Authors: ASTROVA EV RATNIKOV VV VITMAN RF LEBEDEV AA REMENYUK AD RUD YV
Citation: Ev. Astrova et al., STRUCTURE AND PROPERTIES OF POROUS SILICON OBTAINED BY PHOTOANODIZATION, Semiconductors, 31(10), 1997, pp. 1084-1090
GROWTH OF FULLERENE MONOCRYSTALS FROM BEN ZENE SOLUTIONS
Authors: TALYZIN AV RATNIKOV VV SYRNIKOV PP
Citation: Av. Talyzin et al., GROWTH OF FULLERENE MONOCRYSTALS FROM BEN ZENE SOLUTIONS, Fizika tverdogo tela, 38(7), 1996, pp. 2263-2269
GROWTH OF MONOCRYSTALS-C-60 FROM BENZENE SOLUTIONS AND THE X-RAY STRUCTURAL CHARACTERISTICS
Authors: RATNIKOV VV TALYZIN AV SYRNIKOV PP SOROKIN LM
Citation: Vv. Ratnikov et al., GROWTH OF MONOCRYSTALS-C-60 FROM BENZENE SOLUTIONS AND THE X-RAY STRUCTURAL CHARACTERISTICS, Fizika tverdogo tela, 37(2), 1995, pp. 565-567
DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS
Authors: SHULPINA IL ARGUNOVA TS RATNIKOV VV
Citation: Il. Shulpina et al., DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS, Zurnal tehniceskoj fiziki, 65(4), 1995, pp. 180-188
ARRAY FOR REGISTRATION OF DISCRETE GAMMA- SOURCES USING TEMPORAL CHERENKOV DETECTORS
Authors: ANTONOV RA ANOKHINA AM GALKIN VI DZYUBA EO IVANENKO IP KOROSTELEVA EE KUZMICHEV LA MANDRITSKAYA KV RATNIKOV VV ROGANOVA TM SAMSONOV GA KARAKULA S TKACHEK W
Citation: Ra. Antonov et al., ARRAY FOR REGISTRATION OF DISCRETE GAMMA- SOURCES USING TEMPORAL CHERENKOV DETECTORS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(4), 1993, pp. 177-180
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